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主旨 第二週碩博專討演講公告(09/17)
公告日期 2020-09-09
公告內容

碩博專題演講公告

題  目:

應用於電子顯微鏡裡的原位力學性質量測

In-situ Mechanical Property Measurements in Electronic Microscopes

主講人: 魏伯任 博士  Dr. Pal-Jen Wei 

現職: BRUKER NI (HYSITRON), USA駐臺灣分公司 應用科學家

專長領域:機械工程

內容摘要:

Based on the capacitive sensor technology, the PicoIndenters provide researchers with a powerful advanced instrument with excellent versatility. In addition to directly using the indentation function to compress the micro-pillars, particles and other small-sized structures can measure the stress-strain behavior and yield characteristics and observe the deformation mechanism in real time. The push-to-pull (PTP) device can be used to measure the tensile stress-strain behavior of samples such as nanometers and thin films. With the use of the ECM function with electrical signal acquisition and the electrical push-to-pull (E-PTP) device, the resistivity of the sample can be measured by the standard four-point measurement method while the tensile test is performed.
 

時  間:民國 109 年 09 月 17日 下午 3:10

地  點:成功大學成功校區三系館鋼構區(3F)共同教室 A1302演講廳 及 Microsoft Teams直播平台

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最後修改時間 2020-09-09 10:39:49